Conductivity and current-voltage characteristics of PZT thin-film heterostructures

摘要

The conductivity of thin-film Pt/PZT/Pt structures has been studied using the method of current-voltage characteristics. The asymmetry of current-voltage characteristics has been revealed, which indicates that the potential barriers at the interfaces between the studied structures are different, and this asymmetry changes depending on the conditions of synthesis. It has been found that the current-voltage curve on semilogarithmic scales has several linear regions, which gives evidence that several mechanisms determine the conductivity of this structure. Two main conductivity mechanisms have been determined: ohmic mechanism and Frenkel-Poole emission. The conductivity of these structures increases with an increase in temperature, but the shape of the current-voltage characteristics remains unchanged.