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Hopping conductivity and insulator-metal transition in films of touching semiconductor nanocrystals

机译:接触半导体纳米晶体薄膜的跳跃电导率和绝缘体-金属跃迁

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摘要

This paper is focused on the variable-range hopping of electrons in semiconductor nanocrystal (NC) films below the critical doping concentration n(c) at which it becomes metallic. The hopping conductivity is described by the Efros-Shklovskii law, which depends on the localization length of electrons. We study how the localization length grows with the doping concentration n in the film of touching NCs. For that we calculate the electron transfer matrix element t(n) between neighboring NCs for two models when NCs touch by small facets or just one point. We study two sources of disorder: variations of NC diameters and random Coulomb potentials originating from random numbers of donors in NCs. We use the ratio of t (n) to the disorder-induced NC level dispersion to find the localization length of electrons due to the multistep elastic co-tunneling process. We found three different phases at n < n(c) depending on the strength of disorder, the material, sizes of NCs and their facets: (1) "insulator" where the localization length of electrons increases monotonically with n, (2) "oscillating insulator" when the localization length (and the conductivity) oscillates with n from the insulator base, and (3) "blinking metal" where the localization length periodically diverges. The first two phases were seen experimentally and we discuss how one can see the more exotic third one. In all three, the localization length diverges at n = n(c). This allows us to find n(c).
机译:本文重点研究半导体纳米晶体(NC)膜中电子在其变为金属的临界掺杂浓度n(c)以下的可变范围跳跃。跳跃电导率由Efros-Shklovskii定律描述,该定律取决于电子的定位长度。我们研究了接触NCs薄膜中的定位长度如何随掺杂浓度n的增长。为此,当NC接触小面或仅接触一个点时,我们针对两个模型计算相邻NC之间的电子传输矩阵元素t(n)。我们研究了两种疾病的来源:NC直径的变化和源自NCs中随机数供体的随机库仑电势。我们使用t(n)与无序诱导的NC级色散的比率来查找由于多步弹性共隧穿过程而产生的电子的定位长度。我们发现,在n

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