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Conference on Noise in Devices and Circuits

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1.Energy Barriers, Demons, and Minimum Energy Operation of Electronic Devices

机译：能量障碍，恶魔和电子设备的最小能量运行
- 作者：Ralph K. Cavin III;Victor V. Zhirnov;James A. Hutchby;George I. Bourianoff
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- binary switch;
- energy barrier;
- reversible computing;
- adiabatic switching;
- maxwell's demon;
2.Low frequency noise of light emitting diodes

机译：发光二极管的低频噪声
- 作者：S. L. Rumyantsev;S. Sawyer;N. Pala;M. S. Shur;Yu. Bilenko;J. P. Zhang;X. Hu;A. Lunev;J. Deng;R. Gaska
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- light emitting diode;
- LED;
- low frequency noise;
- 1/f noise;
- GaN;
- gallium nitride;
- ultraviolet light;
- UV;
3.Investigating the Differences in Low-Frequency Noise Behavior of npn and pnp SiGe HBTs Fabricated in a Complementary SiGe HBT BiCMOS on SOI Technology

机译：研究SOI技术互补SiGe HBT BICMOS制造的NPN和PNP SiGe HBT的低频噪声行为的差异
- 作者：Enhai Zhao;Ramkumar Krithivasan;Akil K. Sutton;Zhenrong Jin;John D. Cressler;Badih El-Kareh;Scott Balster;Hiroshi Yasuda
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- SiGe HBTs;
- 1/f noise;
- low-frequency noise;
- complementary;
- interfacial oxide;
4.Hot carrier effects on jitter and phase noise in CMOS voltage-controlled oscillators

机译：CMOS电压控制振荡器中的抖动和相位噪声的热载波效应
- 作者：Chi Zhang;Ashok Srivastava
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- phase-locked loop (PLL);
- CMOS VCO;
- hot carriers;
- jitter;
- phase noise;
- device degradation;
- thermal noise;
5.Trap competition inducing R.T.S noise in saturation range in N-MOSFETs

机译：陷阱竞争诱导R.T.S在N-MOSFET中饱和范围内的噪声
- 作者：C.LEYRIS;A.HOFFMANN;M.VALENZA;J-C.VILDEUIL;F.ROY
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- N-MOSFETs;
- l/f;
- R.T.S fluctuations;
- saturation range;
- trap competition;
- multi-trap activities;
6.Characterization of 1/f noise in GaN-based HEMTs under high dc voltage stress

机译：高直流电压应力下GaN的悬臂中1 / f噪声的表征
- 作者：S.K. Jha;C.F. Zhu;E. Jelenkovic;K. Y. Tong;C. Surya;H. Schweizer;M. Pilkuhn
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
7.Comparison of 1/f noise in complementary NPN and PNP polysilicon emitter bipolar transistors

机译：互补NPN和PNP多晶硅发射极双极晶体管1 / F噪声的比较
- 作者：Mazhar UL Hoque;Zeynep Celik-Butler;Joe Trogolo;Douglas Weiser;Keith Green
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- 1/f noise;
- polysilicon emitter bipolar transistors;
- interfacial oxide;
- tunneling fluctuations;
- diffusion fluctuations;
8.1/f noise in SOI buried oxides and alternative dielectrics to SiO_2

机译：SOI掩埋氧化物和替代电介质的1 / f噪声与SIO_2
- 作者：Daniel M. Fleetwood;Hao D. Xiong;Jonathan S. Lin
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- 1/f noise;
- silicon-on-insulator (SOI);
- high-K dielectrics;
- MOSFETs;
- radiation effects;
- buried oxide;
- total dose;
- oxide traps;
- quasi double-gate mode;
9.Nanoscale MOS devices: device parameter fluctuations and low-frequency noise

机译：纳米级MOS设备：设备参数波动和低频噪声
- 作者：Hei Wong;Hiroshi Iwai;J. J. Liou
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- flicker noise;
- nanoscale MOS transistor;
- parameter fluctuation;
- tunneling oxide;
10.A physical understanding of the noise performance of MOS transistors for wireless and lightwave applications in the giga-bit regime

机译：对GIGA钻头制度中无线和光文应用的MOS晶体管噪声性能的物理理解
- 作者：R. P. Jindal
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
11.High Frequency Noise of SOI MOSFETs: Performances and Limitations

机译：SOI MOSFET的高频噪声：性能和限制
- 作者：Francois Danneville;Guillaume Pailloncy;Alexandre Siligaris;Benjamin Iniguez;Gilles Dambrine
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
12.Noise in SiGe HBTs: Opportunities and Challenges

机译：SiGe HBTS的噪音：机会和挑战
- 作者：John D. Cressler
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- SiGe HBT;
- silicon-germanium;
- heterojunction bipolar transistor;
- noise;
- 1/f noise;
- broadband noise;
13.Exploiting metastability and thermal noise to build a re-configurable hardware random number generator

机译：利用稳定性和热噪声构建可重新配置的硬件随机数发生器
- 作者：Daihyun Lim;Damith C. Ranasinghe;Srinivas Devadas;Behnam Jamali;Derek Abbott;Peter H. Cole
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- PUFRNG;
- metastability;
- statistical testing;
- chaos theory;
- thermal noise;
14.Anomalous Low-Frequency Noise Behavior in 210 GHz SiGe HBTs

机译：210 GHz SiGE HBTS中的异常低频噪声行为
- 作者：Zhenrong Jin;Jarle A. Johansen;John D. Cressler;Alvin J. Joseph
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- flicker noise;
- 1/f noise;
- low-frequency noise;
- SiGe HBT;
- BJT;
15.Studying the Dependence of Low-Frequency Noise on Geometrical Shape of Al-Based Thin Film Interconnects

机译：低频噪声对基于铝薄膜互连的几何形状的依赖性研究
- 作者：Kuldeep S. Rawat;Gholam H. Massiha;Jayanta Choudhury
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- low-frequency noise;
- metal thin films;
- VLSI interconnects;
- noise measurement system;
- noise spectral densityq;
16.Analysis and simulation of noise in correlated double sampling imager circuits

机译：相关双采样成像电路噪声的分析与仿真
- 作者：Leonard Forbes;Harish Gopalakrishnan;Weetit Wanalertlak
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
17.Flicker Noise in Nitrided High-k Dielectric NMOS Transistors

机译：氮化高k电介质NMOS晶体管的闪烁噪声
- 作者：Bigang Min;Siva Prasad Devireddy;Zeynep Celik Butler;Ajit Shanware;Keith Green;J. J. Chambers;M. V. Visokay;Luigi Colombo;A. L. P. Rotondaro
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- low-frequency noise;
- high-k dielectrics;
- HfSiON;
- SiON;
- MOSFET;
18.Two-Photon Correlation of Photon Pairs: Near Field and Polarization Effects

机译：光子对的双光子相关性：近场和极化效应
- 作者：C. H. Raymond Ooi;Anil K. Patnaik;Marian O. Scully
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- two-photon correlation;
- quantum eraser;
- spontaneous raman;
- photon pairs;
- antibunching;
- quantum interference;
- near field;
19.A sampling wattmeter for noise power measurements

机译：用于噪声功率测量的采样瓦特计
- 作者：Luca Callegaro;Marco Pisani
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- johnson noise;
- wattmeter;
- noise power;
- noise thermometry;
20.Flicker noise characteristics of MOSFETs with HfO_2, HfAlO_x and Al_2O_3/HfO_2 gate dielectrics

机译：使用HFO_2，HFALO_X和AL_2O_3 / HFO_2栅极电介质的MOSFET的闪烁噪声特性
- 作者：Siva Prasad Devireddy;Bigang Min;Zeynep Celik-Butler;Fang Wang;Ania Zlotnicka;Hsing-Huang Tseng;Philip J Tobin
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- low-frequency noise;
- high-k dielectric;
- hafnium oxide;
- aluminum oxide;
- MOSFET;
21.Nano Device for Monitoring Electrical Fluctuations on Bacteria Scale

机译：用于监测细菌规模电波动的纳米装置
- 作者：Sungkyu Seo;Jong Kim;Maria Dobozi-King;Ryland F. Young;Sergey. M. Bezrukov;Laszlo B. Kish;Mosong Cheng
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- nano device;
- biochip;
- sensor;
- electrical fluctuation;
- noise;
- current;
- bacteria;
- bacteriophage;
- specificity;
22.Quantum Optics as Enabling for Quantum Information Science

机译：量子光学器件作为量子信息科学的启用
- 作者：H. J. Kimble
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- quantum optics;
- cavity quantum electrodynamics;
- quantum information;
23.Low-frequency Noise Measurements used for semiconductors light active devices

机译：用于半导体光源器件的低频噪声测量
- 作者：Jiri Vanek;Zdenek Chobola;Vladimir Brzokoupil;Jiri Kazelle
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- low frequency noise;
- diagnostic;
- V-A characteristics;
- laser diodes;
- silicon;
- solar cells;
24.Noise behaviour of a PNP- and NPN-type SiGe HBT, a simulation study

机译：PNP和NPN型SiGe HBT的噪声行为，模拟研究
- 作者：B. Neinhues;C. Jungemann;B. Meinerzhagen
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- noise;
- SiGe;
- HBT;
- hierarchical simulation;
25.Low-frequency Noise Parameter Extraction in Poly-Si Thin-Film Transistors

机译：多Si薄膜晶体管中的低频噪声参数提取
- 作者：Hyungdo Nam;Hae-Suk Yang;Jungil Lee;Alain Chovet;Bela Szentpali;Eunkyu Kim
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
26.Low Frequency Noise in SOI Transistors

机译：SOI晶体管中的低频噪声
- 作者：Tony Tseng;J. C. S. Woo
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
27.Different Noise Mechanisms in High-k Dielectric Gate Stacks

机译：高k电介质栅极堆叠的不同噪声机制
- 作者：Zeynep Celik-Butler
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- low-frequency noise;
- high-k dielectric;
- MOSFET;
28.Physics of GaN Devices

机译：GaN设备的物理学
- 作者：Michael S. Shur
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
29.Investigation of the trap states and their effect on the low-frequency noise in GaN/AlGaN HFETs

机译：调查陷阱状态及其对GaN / AlGan HFET中低频噪声的影响
- 作者：W.L. Liu;Y.L. Chen;A.A. Balandin;K.L. Wang
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- traps;
- noise;
- capacitance-voltage profiling;
- GaN HFET;
30.A combined noise analysis and power supply current based testing of CMOS analog integrated circuits

机译：CMOS模拟集成电路的组合噪声分析与电源电流测试
- 作者：Ashok Srivastava;Vani K. Pulendra;Siva Yellampalli
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- noise in CMOS op-amp;
- MOS noise model;
- power supply current testing;
- analog CMOS;
- fault injection;
31.A simple noise modeling based testing of CMOS analog integrated circuits

机译：基于CMOS模拟集成电路的简单噪声建模
- 作者：Siva Yellampalli;Ashok Srivastava
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- CMOS amplifier;
- MOS noise modeling;
- fault injection transistor;
- CMOS analog testing;
32.MOSFET 1/f Noise Under Switched Bias Conditions

机译：切换偏置条件下的MOSFET 1 / F噪声
- 作者：Michael. Y. Louie;L. Forbes
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- noise;
- 1/f noise;
- switched bias;
- transients;
33.Why did Intel fail with 60 nanometers? Reiteration of the noise, information, speed and heat aspects of the breakdown of Moore's Law

机译：为什么英特尔用60纳米失败？重申摩尔定法崩溃的噪声，信息，速度和热量方面
- 作者：Laszlo B. Kish;Yingfeng Li
- 会议名称：《Conference on Noise in Devices and Circuits》 | 2005年
- leak current;
- Moore's law;
- power dissipation;
- switching noises;
- thermal noise;