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Cost-effective LFSR synthesis for optimal pseudoexhaustive BIST test sets

机译:具有成本效益的LFSR合成,可用于最佳伪穷尽性BIST测试装置

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The generation of pseudoexhaustive test sets for the built-in self-test (BIST) of combinational circuits is addressed, using as a test pattern generator a simple linear feedback register (LFSR), structure, known as LFSR/SR. It is shown that particular orderings of the LFSR cells can significantly reduce the test set size. In addition, it is shown that an LFSR/SK designed with a particular cell ordering and the allowance of a marginal number of additional cells guarantees pseudoexhaustive test sets of the minimum size 2/sup w/, where w is the maximum input dependency limit of the circuit under test. Extensive experimentation on benchmark circuits and comparisons with the hardware overhead of other methods indicate the advantage of this approach.
机译:通过使用简单的线性反馈寄存器(LFSR)结构(称为LFSR / SR)作为测试模式发生器,解决了组合电路的内置自测试(BIST)的伪穷举测试集的生成问题。结果表明,LFSR单元的特定排序可以显着减小测试集的大小。此外,还表明,采用特定单元顺序设计的LFSR / SK以及允许有少量附加单元,保证了最小大小为2 / sup w /的伪穷举测试集,其中w是最大输入依赖项极限。被测电路。对基准电路的大量实验以及与其他方法的硬件开销的比较表明了这种方法的优势。

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