This paper presents a study of the effects on the electrical behavior of BiCMOS digital circuits induced by bridging faults, whose resistance value is shown to have a strong impact on the static and dynamic behavior of faulty gates and of their fan-out gates. The problem of fault detection is addressed considering different testing techniques (current monitoring, functional, and delay testing). Electrical simulation has been used to investigate the main differences between BiCMOS and CMOS circuits. It is shown that, because of the large driving capability of BJTs, the detection of bridging faults in BiCMOS circuits is more difficult than in the CMOS case when functional or delay testing is used whereas it becomes more effective when adopting current monitoring.
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