Fuzzy-based CMOS circuit partitioning in built-in current testing

摘要

We propose a fuzzy-based approach which provides a soft thresholdnto determine the module size for CMOS circuit partitioning in built-inncurrent testing (BICT). Experimental results show that our designnapproach indeed provides a feasible way to exploit the design space ofnBICT partitioning in comparison with other approaches with a fixednthreshold, and a better module size can thus be determined to reflect anchange of circuit properties