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Timing-Aware Cell Layout De-Compaction for Yield Optimization by Critical Area Minimization

机译:通过关键区域最小化来优化产量的时序感知单元布局解压缩

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This paper proposes a yield optimization method for standard cells under timing constraints. Yield-aware logic synthesis and physical optimization require yield enhanced standard cells and the proposed method automatically creates yield enhanced cell layouts by decompacting the original cell layout using linear programming. We develop a novel accurate linear delay model which approximates the difference from the original delay and use this model to formulate the timing constraints into linear programming. Experimental results show that the proposed method can pick up the yield variants of a cell layout from the tradeoff curve of cell delay versus critical area and is used to create the yield enhanced cell library which is essential to realize yield-aware VLSI design flows.
机译:本文提出了一种在时序约束下针对标准单元的良率优化方法。良率感知逻辑综合和物理优化需要增强良率的标准单元,并且所提出的方法通过使用线性规划对原始单元布局进行解压缩来自动创建良率增强的单元布局。我们开发了一种新颖的精确线性延迟模型,该模型近似于与原始延迟的差异,并使用该模型将时序约束公式化为线性规划。实验结果表明,该方法可以从单元延迟与临界面积的权衡曲线中选取单元布局的良率变化,并用于创建良率增强型单元库,这对于实现良率感知的VLSI设计流程至关重要。

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