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首页> 外文期刊>Very Large Scale Integration (VLSI) Systems, IEEE Transactions on >Design-for-Debug Architecture for Distributed Embedded Logic Analysis
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Design-for-Debug Architecture for Distributed Embedded Logic Analysis

机译:分布式嵌入式逻辑分析的调试设计架构

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摘要

In multi-core designs, distributed embedded logic analyzers with multiple trigger units and trace buffers with real-time offload capability through high-speed trace ports can be placed on-chip. This brings new challenges on how to connect the debug units together in such way that the limited storage space in the trace buffers can be used efficiently. This problem is further aggravated when shadow registers are used to capture data for some signals in the design. In this paper, we propose a new architecture that can dynamically allocate the trace buffers at runtime based on the needs for debug data acquisition coming from multiple data sources and user-programmable priorities. Experimental results show that using the proposed architecture, real-time observability can be improved using only a small amount of on-chip logic hardware, while avoiding excessive storage on-chip.
机译:在多核设计中,可以将具有多个触发单元的分布式嵌入式逻辑分析仪和通过高速跟踪端口具有实时卸载功能的跟踪缓冲区放置在芯片上。这给如何将调试单元连接在一起带来了新的挑战,即如何有效利用跟踪缓冲区中有限的存储空间。当影子寄存器用于捕获设计中某些信号的数据时,该问题会进一步恶化。在本文中,我们提出了一种新的体系结构,该体系结构可根据来自多个数据源和用户可编程优先级的调试数据采集需求,在运行时动态分配跟踪缓冲区。实验结果表明,使用所提出的体系结构,仅使用少量的片上逻辑硬件就可以提高实时可观察性,同时避免了片上过多的存储。

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