Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing

摘要

We propose a compact test generation method for transition faults based on a conflict avoidance driven scheme. A new measure is proposed to estimate the influence inputs, which is the subset of inputs to be specified, needed for detecting transition faults. The value requirements at the pseudoprimary inputs (PPIs) of the second frame of the automatic test pattern generation circuit model are partitioned into separate subsets. The sequential backtracing scheme backtraces the value requirements on the PPIs of the second frame subset-by-subset. Justification of the necessary value requirements at the PPIs in the second frame is completed using a conflict-driven procedure. With an influence input measure for transition faults under the launch-on-capture scan testing application scheme, a new dynamic test compaction scheme is proposed. The new test compaction scheme tries to compact as many faults as possible into the current test. Experimental results and comparison with existing approaches demonstrate the efficiency and effectiveness of the proposed method.