机译:在GF
Department of Computing and Communication Technologies, Oxford Brookes University, Oxford, U.K.;
Application specific integrated circuits (ASICs); Bose–Choudhury–Hocquenghem (BCH) code; Bose???Choudhury???Hocquenghem (BCH) code; Galois field (GF); VLSI; error correction circuit (ECC); multiple event upsets (MEUs); radiation hardening; simple parity; single event upsets (SEUs);
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机译:使用新型交叉奇偶校验码对GF(2m)进行多重错误检测和纠正
机译:用于纠错码和密码系统的高速VLSI架构。
机译:在人类诱导的多能干细胞集落图像分类中的纠错输出代码
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