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Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers

机译:零中频射频收发器的内置自检和数字校准

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We propose a self-test method for zero-IF radio frequency transceivers using primarily loopback, aided by a small built-in self-test (BIST) circuitry, to determine critical performance parameters, such as I/Q imbalance and nonlinearity coefficients. The transceiver is placed in the loopback mode by couplers, specifically designed to be asymmetric with respect to the primary path and the BIST path. The loopback path is also designed to include two traces with slightly different delays to enable parameter deembedding. Transceiver parameters are analytically computed using baseband I and Q signals over two frames, each of which is 200 μs in duration. Overall, measurement time is <;10 ms, including computation time. In addition to loopback hardware support and the associated parameter deembedding methodology, we propose a complimentary BIST circuit to measure the transmitter (TX) gain. The measured parameters can be used for predistortion or postdistortion to calibrate the transceiver, both at production time and in the field. Both simulation and hardware measurement results show that the proposed method can determine the target performance parameters with adequate accuracy for digital calibration. Measurement and the subsequent calibration are shown to reduce TX error vector magnitude more than fivefold, even for significantly impaired systems.
机译:我们提出一种用于零中频射频收发器的自测方法,该方法主要使用环回,并借助小型内置自测(BIST)电路来确定关键性能参数,例如I / Q不平衡和非线性系数。收发器通过耦合器置于环回模式,耦合器专门设计为相对于主路径和BIST路径不对称。环回路径还被设计为包括两条跟踪,这些跟踪的延迟略有不同,以启用参数反嵌入功能。收发器参数是在两个帧中使用基带I和Q信号进行分析计算的,每个帧的持续时间为200μs。总体而言,测量时间<; 10 ms,包括计算时间。除了环回硬件支持和相关的参数去嵌入方法,我们还建议使用一个互补的BIST电路来测量发射机(TX)增益。测量的参数可在生产时和现场用于预失真或后失真以校准收发器。仿真和硬件测量结果均表明,该方法能够以足够的精度确定目标性能参数,以进行数字校准。测量和后续校准显示,即使对于严重受损的系统,也可以将TX误差向量幅度降低五倍以上。

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