机译:RRAM可靠性软错误对基于RRAM的神经形态系统性能的影响研究
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON, Canada;
Department of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA;
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON, Canada;
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON, Canada;
Neurons; Reliability; Neuromorphics; Training; Hafnium compounds; Pattern recognition; Performance evaluation;
机译:具有高精度的基于RRAM的神经形态系统的平行多Buicit编程方案
机译:基于RRAM的神经晶体系统的突触装置(第213 Vol 213,PG 421,2019)
机译:基于RRAM的神经晶体系统的突触装置
机译:基于RRAM的神经形态系统性能的RRAM可靠性软错误分析
机译:分析软件可靠性预测系统中的错误,并应用模型不确定性理论提供更好的预测。
机译:基于RRAM的神经形态系统无需执行操作的加权突触
机译:基于RRAM的模拟神经形态系统中模式识别的时变性