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A 10-bit 500-MS/s Partial-Interleaving Pipelined SAR ADC With Offset and Reference Mismatch Calibrations

机译:具有失调和基准失配校准的10位500-MS / s部分交错流水线SAR ADC

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摘要

A 10-bit 500-MS/s partial-interleaving pipelined successive approximation register (SAR) analog-to-digital converter (ADC) architecture is presented that implements a full-speed 2-bit/cycle SAR at the front end with interleaved residue MDACs and SAR ADCs at the back end. This architecture achieves high speed, while preventing the interleaving spurs. In addition, the design considerations and calibration techniques for gain and offset are also introduced. A histogram stage gain error (HSGE) calibration is implemented to correct the conversion nonlinearities in the digital domain. Measurement results on a 65-nm CMOS prototype show an signal-to-noise distortion ratio (SNDR) of 55.9 dB at dc input and a figure of merit (FoM) of 32 fJ/conversion step at 1.2 V supply.
机译:提出了一种10位500-MS / s部分交错流水线逐次逼近寄存器(SAR)模数转换器(ADC)架构,该架构在前端以交错残差实现全速2位/周期SAR后端的MDAC和SAR ADC。这种架构可实现高速,同时防止交错杂散。此外,还介绍了增益和失调的设计注意事项和校准技术。实施直方图级增益误差(HSGE)校准以校正数字域中的转换非线性。在65纳米CMOS原型上的测量结果显示,直流输入时的信噪失真比(SNDR)为55.9 dB,1.2 V电源时的品质因数(FoM)/转换步长为32 fJ。

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