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Reusing Trace Buffers as Victim Caches

机译:重用跟踪缓冲区作为受害者缓存

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摘要

With the increasing complexity of modern systems-on-chip, the possibility of functional errors escaping design verification is growing. Postsilicon validation targets the discovery of these errors in early hardware prototypes. Due to limited visibility and observability, dedicated design-for-debug (DFD) hardware, such as trace buffers, is inserted to aid postsilicon validation. In spite of its benefit, such hardware incurs area overheads that impose size limitations. However, the effective overhead could be reduced if the area dedicated to DFD could be reused in-field. In this paper, we present a novel method for reusing an existing trace buffer as a victim cache of a processor to enhance the performance. The trace buffer storage space is reused for the victim cache with a small additional controller logic. Simultaneous multithreading allows further fine-grained control of the victim cache, which can be shared between the threads based on the requirements of the applications. We also propose and evaluate different approaches to partition the victim cache between threads. Experimental results on several benchmark applications and trace buffer configurations show that the proposed approach can enhance the average performance by up to 8.3% with a minimal area overhead.
机译:随着现代片上系统的复杂性越来越高,逃避设计验证的功能错误的可能性也在增长。后硅验证的目标是在早期硬件原型中发现这些错误。由于可见性和可观察性有限,因此插入了专用的调试设计(DFD)硬件,例如跟踪缓冲区,以帮助进行硅后验证。尽管有其好处,但此类硬件会产生面积开销,从而增加了大小限制。但是,如果可以专用于DFD的区域在现场重新使用,则可以减少有效开销。在本文中,我们提出了一种新颖的方法,用于将现有的跟踪缓冲区重用为处理器的牺牲品缓存,以提高性能。跟踪缓冲区存储空间可通过少量的附加控制器逻辑重新用于受害者缓存。同步多线程允许对受害者高速缓存进行进一步的细粒度控制,可以根据应用程序的需求在线程之间共享这些高速缓存。我们还提出并评估了在线程之间划分受害者缓存的不同方法。在一些基准测试应用程序和跟踪缓冲区配置上的实验结果表明,该方法可以以最小的面积开销将平均性能提高8.3%。

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