机译:结合Flash ADC和TDC的900MHz,3.5mW,8位流水线子范围ADC
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Department of Electrical and Electronics Engineering, Kagoshima University, Kagoshima, Japan;
Logic gates; Time-domain analysis; Signal processing; Calibration; CMOS technology; Capacitors; Power dissipation;
机译:具有时域量化器的500MS / s,2.0mW,8位细分ADC
机译:具有时域量化器的500MS / s,2.0mW,8位细分ADC
机译:采用55nm CMOS的16mW 8位1-GS / s数字细分ADC
机译:具有Flash ADC和Vernier TDC的900MHz,3.5mW,8位管线子范围ADC
机译:90nm GP CMOS中的1V 2.5GS / s 8位自校准闪存ADC。
机译:基于直方图的管道ADC校准方法
机译:具有0.13μmCMOS的闪光灯和SAR ADC的1-V690μW8位200 MS / S闪存SAR ADC