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A 900-MHz, 3.5-mW, 8-bit Pipelined Subranging ADC Combining Flash ADC and TDC

机译:结合Flash ADC和TDC的900MHz,3.5mW,8位流水线子范围ADC

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In this paper, we propose a time-based analog-to-digital converter (ADC) architecture combining a flash ADC and vernier time-to-digital converter (TDC) to achieve both high speed and high resolution. The flash ADC and vernier TDC are pipelined to increase the conversion speed. A charge-steering amplifier is used for low-power residue transfer. A common level adjuster is added to the output stage of the charge-steering amplifier to stabilize the output common level against process, voltage, and temperature variation. Moreover, the vernier TDC using a dynamic delayer enables low-power operation. An 8-bit ADC test chip fabricated with 65-nm CMOS technology had a high sampling frequency (900 MHz) and low power consumption (3.5 mW). The figure of merit was 32 fJ/conversion step.
机译:在本文中,我们提出了一种基于时间的模数转换器(ADC)架构,该架构结合了Flash ADC和游标时间数字转换器(TDC)来实现高速和高分辨率。闪存ADC和游标TDC通过流水线传输以提高转换速度。电荷控制放大器用于低功率残留传输。公共电平调节器被添加到电荷控制放大器的输出级,以针对过程,电压和温度变化稳定输出公共电平。此外,使用动态延迟器的游标TDC可实现低功耗操作。采用65纳米CMOS技术制造的8位ADC测试芯片具有高采样频率(900 MHz)和低功耗(3.5 mW)。品质因数为32 fJ /转换步长。

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