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Exploiting Hardware Unobservability for Low-Power Design and Safety Analysis in Formal Verification-Driven Design Flows

机译:在正式验证驱动的设计流程中利用硬件不可观察性进行低功耗设计和安全分析

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Formal techniques for the functional verification of System-on-Chip (SoC) hardware have matured significantly over the last years. They can penetrate deeply into a design to exhibit complex functional dependencies between various design components in terms of detailed logical and temporal relationships. They can also provide a well-defined formal relationship between an abstract system model of a design and its concrete implementation at the register-transfer level (RTL). This paper shows how such knowledge available from formal verification can be "condensed" into a database that stores all registers and flip-flops, at which time points they are actually relevant for the correct behavior of the design and when they are not. We show that the comprehensive information on temporary unobservabilities in the design can be of great value to reach two nonfunctional design goals that play a dominant role in many design flows: safety and low power consumption. This paper presents techniques to assess the effects of soft errors by single-event upsets (SEUs) with formal precision and to relate the results of the proposed analysis to an abstract system model. For example, our analysis can determine which soft errors may lead to a system "crash" and which are guaranteed not to cause any harm. For the application of the proposed approach in power optimization, this paper presents techniques for clock gating and power gating. For the examined designs, we observe a reduction of power consumption between 10% and 50% on top of the state-of-the-art commercial power synthesis.
机译:在过去几年中,用于片上系统(SoC)硬件功能验证的正式技术已经非常成熟。它们可以深入地渗透到设计中,从而在详细的逻辑和时间关系方面展现出各个设计组件之间的复杂功能依赖性。它们还可以在寄存器转移级别(RTL)的设计的抽象系统模型与其具体实现之间提供良好定义的形式关系。本文展示了如何将形式验证中获得的知识“压缩”到存储所有寄存器和触发器的数据库中,在什么时候它们实际上与设计的正确行为相关,而在什么时候它们与设计的正确行为无关。我们表明,有关设计中暂时不可观察性的全面信息对于实现在两个设计流程中起主要作用的两个非功能性设计目标具有重要价值:安全性和低功耗。本文介绍了一些技术,这些技术可以通过具有形式精度的单事件翻转(SEU)评估软错误的影响,并将建议的分析结果与抽象的系统模型相关联。例如,我们的分析可以确定哪些软错误可能导致系统“崩溃”,哪些保证不会造成任何伤害。对于所提出的方法在功率优化中的应用,本文提出了时钟门控和功率门控技术。对于经过检查的设计,我们观察到在最先进的商用电源综合技术之上,功耗可降低10%至5​​0%。

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