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A new detection method for microcalorimetry of single crystal surfaces

机译:单晶表面微量热检测的新方法

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Determining the strength of surface chemical bonds and its variation with surface structure, coverage of adsorbates, co-adsorbates, etc. represents the most fundamental and important of all measurements in surface science, and of course this thermodynamics underlies the application of surface science to many technologies. It is also the key measurement to benchmark approximations in increasingly accurate density functional theory calculations. The traditional measurement techniques are indirect and rely on desorption, e.g., thermal desorption spectroscopy or measuring isosteric heats. Although these techniques have proven powerful for many traditional reversible adsorption systems, they are only useful if the adsorbates do not form another high-temperature phase at the desorption temperature, e.g., dissociate, cluster, diffuse into the bulk or react with co-adsorbates. Direct calorimetric measurements of adsorption heat avoid this limitation. However, because of sensitivity, calorimetry is limited to large surface area samples or thin films. While there is a long history of such measurements on heterogeneous samples, application to thin film single crystals is only a decade old. Single crystal adsorption calorimetry was pioneered by D.A. King's group at Cambridge who used IR emission from the (C coated) back side of a thin single crystal to measure the temperature rise and hence differential heat of adsorption. They have used this technique to measure a variety of reversible [e.g., CO/Ni(100)] and irreversible adsorption systems [e.g., O_2/Ni(110)]. C.T. Campbell's group at Washington have subsequently developed a single crystal calorimeter similar to that of King et al. but using a thin pyroelectric polymer ribbon which is mechanically driven to make a gentle mechanical/thermal contact to the back side of the thin single crystal film to measure the temperature rise. This detection technique has several advantages relative to that of the original King calorimeter and has led to more general applicability of microcalorimetry, e.g., to the measurement of differential heats of adsorption of metals on oxides and metals on polymers. In this issue, the article by Punckt, Bodega and Rotermund introduces a new method for detection in single crystal microcalorimetry. They show that mechanical deformation of a supported thin single crystal is caused by thermal expansion as a result of the heat released in a surface chemical reaction, and this topography change can be measured very sensitively by using the thin film as one of the mirrors in a Michelson interferometer. The authors use a lateral imaging detector to measure the mechanical deformation of the thin crystal. They demonstrate the viability of this technique by titrating a CO covered 300 nm thick Pt(110) foil with O_2 at ~10~(-5) bar. The heat released during the reaction causes a thermal expansion and mechanical buckling which is detected interferometrically with a resolution of 20 nm and giving a theoretical sensitivity of a few nJ thermal input. In fact, under certain conditions (surface temperature and pressure of O_2), propagation of mechanical deformation fronts are observed that is related to the propagation of reaction fronts. This demonstrates that this detection technique can also be used as a spatially resolving microcalorimeter. The authors compare several aspects of their detection method to those of King and Campbell.
机译:确定表面化学键的强度及其随表面结构的变化,被吸附物,共被吸附物的覆盖率等是表面科学中所有测量中最基本和最重要的,当然,这种热力学是将表面科学应用于许多领域的基础技术。这也是在越来越精确的密度泛函理论计算中基准逼近的关键度量。传统的测量技术是间接的并且依赖于解吸,例如,热解吸光谱法或测量等排热。尽管已证明这些技术对于许多传统的可逆吸附系统是有效的,但它们仅在被吸附物在解吸温度下不形成另一个高温相(例如,解离,成簇,扩散到本体中或与共被吸附物反应)时才有用。吸附热的直接量热测量避免了这种限制。但是,由于灵敏度高,量热法仅限于大表面积的样品或薄膜。尽管在异质样品上进行此类测量的历史由来已久,但应用于薄膜单晶的历史只有十年之久。单晶吸附量热法是D.A.剑桥大学金氏研究小组使用薄单晶(C涂层)背面的IR发射来测量温度升高,从而测量吸附的差热。他们已经使用这种技术来测量各种可逆的[例如CO / Ni(100)]和不可逆的吸附系统[例如O_2 / Ni(110)]。 C.T.华盛顿的坎贝尔小组后来开发了一种类似于King等人的单晶热量计。但要使用热释电聚合物薄带,该带会受到机械驱动,从而与薄单晶膜的背面形成柔和的机械/热接触,以测量温度升高。相对于原始的King热量计,该检测技术具有多个优点,并且导致了微量量热法的更普遍的适用性,例如,用于测量金属在氧化物上的吸附差热和金属在聚合物上的吸附差热。在本期中,Punckt,Bodega和Rotermund的文章介绍了一种用于单晶微量量热法检测的新方法。他们表明,表面化学反应释放出的热量是由热膨胀引起的,支撑的薄单晶的机械变形,通过使用薄膜作为玻璃中的一面反射镜,可以非常灵敏地测量这种形貌变化。迈克尔逊干涉仪。作者使用横向成像检测器来测量薄晶体的机械变形。他们通过在〜10〜(-5)bar下用O_2滴定一氧化碳覆盖的300 nm厚Pt(110)箔来证明该技术的可行性。反应过程中释放的热量会引起热膨胀和机械弯曲,这些干涉会通过干涉仪以20 nm的分辨率进行检测,并提供几nJ热输入的理论灵敏度。实际上,在某些条件下(表面温度和O_2的压力),观察到与反应前沿的传播有关的机械变形前沿的传播。这表明该检测技术也可以用作空间分辨微热量计。作者将其检测方法的多个方面与King和Campbell的检测方法进行了比较。

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