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首页> 外文期刊>Superlattices and microstructures >Thickness effects on physical and electrical properties of Zn_(0.97)Co_(0.02)In_(0.01)O thin films grown by magnetron sputtering RF
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Thickness effects on physical and electrical properties of Zn_(0.97)Co_(0.02)In_(0.01)O thin films grown by magnetron sputtering RF

机译:厚度对磁控溅射射频生长Zn_(0.97)Co_(0.02)In_(0.01)O薄膜物理和电学性质的影响

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摘要

The effects of thickness on physical properties (structural, morphological, optical and electrical) of Zn0.97Co0.02In0.01O (CIZO) thin films with different thicknesses grown at room temperature were investigated in this study. Zn0.97Co0.02In0.01O thin films have been grown by Radio Frequency magnetron sputtering on glass substrate followed by a rapid annealing treatment at 400 degrees C for 10 min. X-ray diffraction (XRD) measurement display that the Zn0.97Co0.02In0.01O thin films exhibited hexagonal wurtzite phase with a preferred orientation along the c-axis. We observe a strong single peak corresponding to the (002) phase obvious on the diffractograms. The crystallite size values exhibit an increasing tendency and the dislocation density indicates a decreasing trend with increasing thickness, this shows that the material is relaxing. Concerning the SEM micrographs, it was observed that the average grain size increased from 20 nm to 80 nm, with thickness ranging from 150 nm to 450 nm. The roughness surface (RMS) measured by AFM increased from 4.309 nm to 11.392 nm with a rising thickness. Raman spectroscopy was used to study structural properties of complex oxides at a local level. All films were highly transparent in the visible region with an average transmittance of 96%. Growing the thickness enhance the optical band gap, from 3.106 eV to 3.439 eV. Optical parameters such as absorption coefficient, refractive index, dispersion parameters and dielectric constants were studied to investigate the influence of thickness on optical properties of Zn0.97Co0.02In0.01O thin films. The thickness improves the electrical resistivity of Zn0.97Co0.02In0.01O thin films. It has been found from electrical measurements that films with a thickness of 450 nm have the lowest resistivity of 2.9 10(-3) Omega cm. Once the merit factor determined, we noted that the 450 nm sample having a better TCO of value 12.2 10(3) Omega(-1).
机译:研究了厚度对室温下生长的不同厚度的Zn0.97Co0.02In0.01O(CIZO)薄膜的物理性能(结构,形态,光学和电学)的影响。通过射频磁控溅射在玻璃基板上生长Zn0.97Co0.02In0.01O薄膜,然后在400摄氏度下快速退火处理10分钟。 X射线衍射(XRD)测量显示Zn0.97Co0.02In0.01O薄膜表现出六方纤锌矿相,并沿c轴具有最佳取向。我们在衍射图上观察到一个与(002)相相对应的强单峰。微晶尺寸值表现出增加的趋势,并且位错密度表明随着厚度的增加而减少的趋势,这表明材料是松弛的。关于SEM显微照片,观察到平均晶粒尺寸从20nm增加至80nm,厚度范围为150nm至450nm。 AFM测量的粗糙度表面(RMS)随着厚度的增加从4.309 nm增加到11.392 nm。拉曼光谱法用于研究局部水平上复杂氧化物的结构性质。所有薄膜在可见光区域都是高度透明的,平均透射率为96%。厚度的增加使光学带隙从3.106 eV增至3.439 eV。研究了吸收系数,折射率,色散参数和介电常数等光学参数,以研究厚度对Zn0.97Co0.02In0.01O薄膜光学性能的影响。厚度提高了Zn0.97Co0.02In0.01O薄膜的电阻率。从电学测量发现,厚度为450 nm的薄膜的最低电阻率为2.9 10(-3)Ω·cm。确定优值因子后,我们注意到450 nm样品的TCO值更好,为12.2 10(3)Omega(-1)。

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