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A comparison of Ⅰ-Ⅴ characteristics of graphene silicon and graphene-porous silicon hybrid structures

机译:石墨烯硅和石墨烯-多孔硅杂化结构的Ⅰ-Ⅴ特性比较

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摘要

A novel Graphene/Porous Silicon hybrid device is fabricated and its electrical behaviors are studied along with a Graphene/Silicon device. Graphene (G) is prepared by exfoliation of graphite foil in aqueous solution of inorganic salt. Porous Silicon (PS) is fabricated by electrochemical etching of p-type Si. Graphene is deposited on the surface of Si and PS substrates by the Thermal Spray Pyrolysis (TSP) method. The current-voltage relationships of G/Si and G/PS devices are derived and studied under different volumes of graphene. The results reveal that there are important differences in the I-V characteristics of G/Si and G/PS devices in the forward as well as reverse bias. Furthermore, varying the volume of graphene deposition on Si and PS substrates have contrary effects on their I-V characteristics.
机译:制备了一种新颖的石墨烯/多孔硅混合器件,并与石墨烯/硅器件一起研究了其电学行为。石墨烯(G)是通过在无机盐的水溶液中剥离石墨箔而制备的。多孔硅(PS)是通过p型Si的电化学蚀刻制成的。石墨烯通过热喷涂热解(TSP)方法沉积在Si和PS基板的表面上。在不同体积的石墨烯下,得出并研究了G / Si和G / PS器件的电流-电压关系。结果表明,在正向和反向偏置中,G / Si和G / PS器件的I-V特性存在重要差异。此外,改变石墨烯在Si和PS衬底上的沉积量对其I-V特性具有相反的影响。

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