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首页> 外文期刊>Superlattices and microstructures >Modelling and simulation of tri-material gate stack gate all-around (TMGSGAA) MOSFET using Legendre Wavelets for analog/RF applications
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Modelling and simulation of tri-material gate stack gate all-around (TMGSGAA) MOSFET using Legendre Wavelets for analog/RF applications

机译:使用Legendre小波对模拟/ RF应用的三材料栅极叠层栅极全能(TMGSGAA)MOSFET进行建模和仿真

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摘要

In this work, a 2D modelling of tri-material gate stack gate all around (TMGSGAA) MOSFET considering quantum mechanical effects is developed and its analog/RF characteristics are simulated. A self-consistent solution of 2D Poisson-Schrodinger equation has been obtained using Legendre Wavelets. It provides accurate results by performing efficient computation using adaptive mesh obtained by multiresolution approach. The accuracy of the method has been verified with TCAD simulation results. A systematic, quantitative investigation of main figure of merit (FOMs) for the device is carried out to demonstrate its improved RF/analog performance. The results show an improvement in drain current, I_(on)/ I_(off) ratio, transconductance, f_T and f_(max) providing superior RF performance under low-power operating conditions.
机译:在这项工作中,开发了一种考虑了量子力学效应的三材料栅极全栅(TMGSGAA)MOSFET的二维建模,并对其模拟/ RF特性进行了仿真。使用Legendre小波已经获得了二维Poisson-Schrodinger方程的自洽解。通过使用通过多分辨率方法获得的自适应网格执行高效计算,可以提供准确的结果。 TCAD仿真结果验证了该方法的准确性。对设备的主要品质因数(FOM)进行了系统的定量研究,以证明其改进的RF /模拟性能。结果表明,漏极电流,I_(on)/ I_(off)比,跨导,f_T和f_(max)的改善在低功率工作条件下提供了出色的RF性能。

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