首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 117-mm/sup 2/ 3.3-V only 128-Mb multilevel NAND flash memory for mass storage applications
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A 117-mm/sup 2/ 3.3-V only 128-Mb multilevel NAND flash memory for mass storage applications

机译:117mm / sup 2 / 3.3V仅128Mb多级NAND闪存,适用于大容量存储应用

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For a quantum step in further cost reduction, the multilevel cell concept has been combined with the NAND flash memory. Key requirements of mass storage, low cost, and high serial access throughput have been achieved by sacrificing fast random access performance. This paper describes a 128-Mb multilevel NAND flash memory storing 2 b per cell. Multilevel storage is achieved through tight cell threshold voltage distribution of 0.4 V and is made practical by significantly reducing program disturbance by using a local self-boosting scheme. An intelligent page buffer enables cell-by-cell and state-by-state program and inhibit operations. A read throughput of 14.0 MB/s and a program throughput of 0.5 MB/s are achieved. The device has been fabricated with 0.4-/spl mu/m CMOS technology, resulting in a 117 mm/sup 2/ die size and a 1.1 /spl mu/m/sup 2/ effective cell size.
机译:为了进一步降低成本,多级单元概念已与NAND闪存相结合。大容量存储,低成本和高串行访问吞吐量的关键要求已通过牺牲快速随机访问性能来实现。本文介绍了一个128 Mb的多级NAND闪存,每个单元存储2 b。多电平存储通过0.4 V的严格单元阈值电压分布来实现,并且通过使用局部自升压方案显着减少程序干扰而变得可行。智能页面缓冲器可实现逐单元和逐状态编程,并禁止操作。读取吞吐量为14.0 MB / s,程序吞吐量为0.5 MB / s。该器件采用0.4- / splμm/ m CMOS技术制造,其裸片尺寸为117 mm / sup 2 /,有效单元尺寸为1.1 / splμu/ m / sup 2 /。

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