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Circuit implementations of the differential capacitance read scheme (DCRS) for ferroelectric random-access memories (FeRAM)

机译:铁电随机存取存储器(FeRAM)的差分电容读取方案(DCRS)的电路实现

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This paper presents two circuit implementations for the differential capacitance read scheme (DCRS) in ferroelectric random-access memories (FeRAM). Compared to the conventional read scheme, DCRS achieves a faster read access by activating the sense amplifiers immediately after a wordline is activated. By relying on the capacitance difference instead of the charge difference, DCRS avoids raising the highly capacitive platelines until after the read is complete. We have implemented this scheme in a 0.35-Μm CMOS+Ferro test chip that includes an array of 256 × 32 2T-2C cells. The test chip measures an access time of 45 ns at a power supply of 3 V.
机译:本文介绍了铁电随机存取存储器(FeRAM)中差分电容读取方案(DCRS)的两种电路实现。与传统的读取方案相比,DCRS通过在字线被激活后立即激活读出放大器来实现更快的读取访问。通过依靠电容差而不是电荷差,DCRS可以避免在读取完成之前升高高电容性的印版线。我们已经在0.35μmCMOS + Ferro测试芯片中实现了该方案,该芯片包括256×32 2T-2C单元阵列。测试芯片在3 V电源下测量的访问时间为45 ns。

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