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A CMOS Sensor Optimized for Laser Spot-Position Detection

机译:针对激光光斑检测而优化的CMOS传感器

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摘要

An optical sensor architecture optimized for flying-spot, triangulation-based, three-dimensional (3-D) laser scanners will be presented. The architecture implements a spot-position detection algorithm based on a two-step procedure that allows for improved dynamic range and readout speed. The sensor, which contains two linear arrays of pixels, analog readout channels, and digital signal preprocessing circuitry, has been fabricated in 0.6-(mu)m CMOS double-poly triple-metal technology and measures 8.17 X 5.67 mm~(2). Pixel size and shape have been selected for reducing the effect of laser speckle and for the possibility of measuring color in a multiwavelength 3-D scanner. Electrooptical test results confirm the sensor behavior as expected from simulations on a dynamic range of 80 dB and exhibits a maximum speed of 50-k voxel/s.
机译:将介绍针对飞点,基于三角测量的三维(3-D)激光扫描仪进行了优化的光学传感器架构。该体系结构基于两步过程实现了点位置检测算法,从而提高了动态范围和读出速度。该传感器包含两个像素的线性阵列,模拟读出通道和数字信号预处理电路,采用0.6-μmCMOS双多晶硅三金属技术制造,尺寸为8.17 X 5.67 mm〜(2)。选择了像素大小和形状以减少激光散斑的影响,并可以在多波长3-D扫描仪中测量颜色。电光测试结果证实了在80 dB的动态范围内仿真所期望的传感器性能,并且最大速度为50-k voxel / s。

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