首页> 外文会议>Conference on integrated photonics: Materials, devices, and applications >A speckle-based CMOS sensor array for arbitrary surface movement detection A speckle-based CMOS sensor array for arbitrary surface movement detection A speckle-based CMOS sensor array for arbitrary surface movement detection A speckle-based CMOS sensor array for arbitrary surface movement detection
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A speckle-based CMOS sensor array for arbitrary surface movement detection A speckle-based CMOS sensor array for arbitrary surface movement detection A speckle-based CMOS sensor array for arbitrary surface movement detection A speckle-based CMOS sensor array for arbitrary surface movement detection

机译:用于任意表面移动检测的基于斑点的CMOS传感器阵列,用于任意表面移动检测一个基于散斑的CMOS传感器阵列,用于任意表面移动检测散斑的CMOS传感器阵列,用于任意曲面运动检测的斑点基CMOS传感器阵列

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The paper presents a CMOS sensor array for the detection of speckle movements, for applications requiring accurate movement tracking of arbitrary surfaces. The array is made of eight sensors incorporating each a spatial comb filter with a pitch of 2.8μm so as to be direction-sensitive to the movement of speckles with corresponding direction and spatial frequency, defined by the optical geometry of the system. The circuit is used with an array of micro-lenses placed between the sensor and the laser-illuminated surface. With speckle statistics (contrast, size) being independent on the surface properties, the detection works on virtually any surface. The system is operated at a sampling frequency of 64kHz. Integrated into a 180nm CMOS process, the circuit active area occupies 1.9mm2 and consumes 290μW at full speed, allowing a maximal stable tracking speed of the surface of 0.25 m/s and a tracking accuracy of about 5μm
机译:本文介绍了用于检测散斑运动的CMOS传感器阵列,用于需要准确地移动任意表面的应用。该阵列由八个传感器制成,该传感器包括每个空间梳状滤波器,间距为2.8μm,以便对具有相应方向和空间频率的斑点的移动方向敏感,由系统的光学几何定义。该电路用于放置在传感器和激光照射表面之间的微透镜阵列。具有散斑统计(对比度,大小)独立于曲面属性,检测几乎在任何表面上工作。该系统以64kHz的采样频率运行。集成到180nm CMOS工艺中,电路有效面积占据1.9mm2并以全速消耗290μW,允许表面的最大稳定的跟踪速度为0.25 m / s,跟踪精度约为5μm

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