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Study of InGaP/InGaAs double doped channel heterostructure field-effect transistors (DDCHFETs)

机译:InGaP / InGaAs双掺杂沟道异质结构场效应晶体管(DDCHFET)的研究

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摘要

InGaP/InGaAs double doped channel heterostructure field-effect transistors (DDCHFETs) with δ-doped channels and uniformly doped channels are comprehensively studied and demonstrated. From the simulation results, based on a two-dimensional simulator of Atlas, the band diagrams, DC and RF characteristics of studied devices are compared and studied. The better drain current drivability, higher transconductance and microwave performances are obtained in the studied device with δ-doped channel. In addition, experimentally, the DDCHFET with δ-doped quantum well channel is fabricated successfully. Due to the employed InGaAs double δ-doped channel structure and Schottky behaviours of InGaP 'insulator', good DC properties including pinch-off and saturation characteristics, higher and linear transconductance, and good RF properties are obtained. Moreover, the experimental results are consistent with simulated data.
机译:全面研究并证明了具有δ掺杂沟道和均匀掺杂沟道的InGaP / InGaAs双掺杂沟道异质结构场效应晶体管(DDCHFET)。根据仿真结果,基于Atlas的二维仿真器,比较并研究了所研究设备的能带图,DC和RF特性。在所研究的具有δ掺杂沟道的器件中,获得了更好的漏极电流驱动性,更高的跨导和微波性能。另外,通过实验成功地制备了具有δ掺杂的量子阱沟道的DDCHFET。由于采用了InGaAs双δ掺杂沟道结构和InGaP'绝缘体'的肖特基行为,因此可以获得良好的DC特性,包括夹断和饱和特性,较高和线性的跨导以及良好的RF特性。此外,实验结果与模拟数据一致。

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