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首页> 外文期刊>Semiconductor Science and Technology >Vacancies and negative ions in as-grown and ion-bombarded p-InP(Zn) observed by positron annihilation
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Vacancies and negative ions in as-grown and ion-bombarded p-InP(Zn) observed by positron annihilation

机译:通过正电子an没观察到生长和离子轰击的p-InP(Zn)中的空位和负离子

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摘要

Defects in as-grown and ion-bombarded p-InP crystals have been investigated by positron lifetime measurements. The result showed that indium vacancies existed in as-grown p-lnP In addition, Zn impurities Zn_In~- were also observed, which are negative and act as shallow trapping centres at low temperatures. Ion bombardment at lower dose introduced some monovacancies, and with increasing ion dose, divacancies were also observed, which coexisted with monovacancies. The temperature experiment showed that antisite defects were also produced upon bombardment, which we attribute to the negatively charged In_P antisites.
机译:已通过正电子寿命测量研究了生长中和离子轰击的p-InP晶体中的缺陷。结果表明,生长的p-InP中存在铟空位。此外,还观察到了Zn杂质Zn_In〜-,它们为负,并在低温下充当浅陷阱中心。较低剂量的离子轰击引入了一些单空位,并且随着离子剂量的增加,也观察到了空位,其与单空位并存。温度实验表明,轰击也产生了抗位缺陷,这归因于带负电荷的In_P抗位。

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