机译:通过预偏置测量方法改善InGaZnO薄膜晶体管中NO_2气敏特性
Chung Ang Univ, Sch Elect & Elect Engn, Seoul, South Korea;
Chung Ang Univ, Sch Elect & Elect Engn, Seoul, South Korea;
Chung Ang Univ, Sch Elect & Elect Engn, Seoul, South Korea;
Chung Ang Univ, Sch Elect & Elect Engn, Seoul, South Korea;
Chung Ang Univ, Sch Elect & Elect Engn, Seoul, South Korea;
Chung Ang Univ, Sch Elect & Elect Engn, Seoul, South Korea;
pre-bias measurement technique; IGZO; NO2 gas-sensing; thin-film transistor;
机译:通过预偏置测量方法改进Ingazno薄膜晶体管中的NO_2气体传感性能
机译:利用$ hbox {SiN} _ {x} $和$ hbox {SiO} _ {2} $栅极电介质通过低频噪声测量验证a-InGaZnO薄膜晶体管的界面状态特性
机译:高k SrTa_2O_6溅射沉积栅绝缘子改善非晶InGaZnO薄膜晶体管。
机译:氟化氮化硅钝化改善InGaZnO薄膜晶体管的电性能和偏置稳定性
机译:透明薄膜晶体管的低成本沉积方法。
机译:通过使用富氢Al2O3介电层实现具有极低热收支的高性能a-InGaZnO薄膜晶体管
机译:聚(4-乙烯基苯酚)绝缘体对InGazno薄膜晶体管电子性质的影响