Logic Technologies Face Off At Iedm

摘要

Intel researchers will discuss the company's 32 nm platform this month in a late paper submitted to the 2008 International Electron Devices Meeting (IEDM), and describe a record-performance InSb-based pFET. IBM researchers will present a 22 nm SRAM test chip at IEDM, and several other logic vendors will detail their most advanced process technologies.