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FBDTester 2.0: Automated test sequence generation for FBD programs with internal memory states

机译:FBDTester 2.0:具有内部存储器状态的FBD程序的自动测试序列生成

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As Function Block Diagram (FBD) programs are used to implement safety-critical systems such as nuclear reactor protection systems, it is crucial to generate effective test cases. FBD programs are running on programmable logic controllers (PLCs) that execute the programs repeatedly within a particular scan time. Among the elements of FBD programs, function blocks and feedback variables save the inputs or outputs of the previous scan cycle into internal memories. The data stored in the internal memory are used to operate the function blocks of the next scan cycle. Researchers have recently developed an automated test generation technique aiming to satisfy several structural test coverage criteria for FBD programs. Among them, Jee et al.'s approach has an advantage of generating tests from FBD programs without requiring any intermediate models. However, test sequence generation for FBD programs with internal memory states was not fully automated in Jee et al.'s approach. This paper extends Jee et al.'s work by generating test sequences from FBD programs with internal memory states in a fully automated manner. The key technique involves explicitly unwinding FBD programs and solving the test requirements using an SMT solver. We conduct experiments on increasing the coverage of test requirements by unwinding cycles and evaluating the effectiveness of the test set using mutation analysis with several subject programs, including a real-world reactor protection system. The experimental results show that the proposed approach is able to generate effective test sequences for FBD programs. To demonstrate the efficiency of the proposed approach, we compared the test sequence generation time required for our approach with those for other approaches. The comparison results show that even excluding the generation time of test models of other approaches, the proposed approach increased the time-efficiency by more than 11 times. (C) 2018 Elsevier B.V. All rights reserved.
机译:由于功能框图(FBD)程序用于实现对安全至关重要的系统(例如核反应堆保护系统),因此生成有效的测试用例至关重要。 FBD程序在可编程逻辑控制器(PLC)上运行,它们在特定的扫描时间内重复执行该程序。在FBD程序的各个元素中,功能块和反馈变量将前一个扫描周期的输入或输出保存到内部存储器中。内部存储器中存储的数据用于操作下一个扫描周期的功能块。研究人员最近开发了一种自动测试生成技术,旨在满足FBD程序的一些结构测试覆盖标准。其中,Jee等人的方法具有无需任何中间模型即可从FBD程序生成测试的优势。但是,在Jee等人的方法中,具有内部存储器状态的FBD程序的测试序列生成不是完全自动化的。本文通过以完全自动化的方式从具有内部存储器状态的FBD程序生成测试序列,扩展了Jee等人的工作。关键技术涉及显式展开FBD程序并使用SMT求解器解决测试要求。我们进行实验,通过展开周期来扩大测试要求的覆盖面,并使用突变分析和几个主题程序(包括实际的反应堆保护系统)来评估测试集的有效性。实验结果表明,该方法能够为FBD程序生成有效的测试序列。为了证明所提出方法的效率,我们将本方法与其他方法所需的测试序列生成时间进行了比较。比较结果表明,即使不考虑其他方法的测试模型的生成时间,所提出的方法也将时间效率提高了11倍以上。 (C)2018 Elsevier B.V.保留所有权利。

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