...
首页> 外文期刊>Science in China. Series A >Piezoresistive effect in p-type polycrystalline diamond films
【24h】

Piezoresistive effect in p-type polycrystalline diamond films

机译:p型多晶金刚石薄膜的压阻效应

获取原文
获取原文并翻译 | 示例

摘要

The peiezoresistive effect of boron-doped polycrystalline diamond films was analyzed and discussed by the famous M-S polycrystalline model. It is found that the valence bands splitting-off and the grain-boundary scattering are the main factors responsible for the piezoresistive effect in the p-type polycrystalline diamond films. The gauge-factor calculation formula including the effect of both background scattering and grain-boundary scattering were obtained, and the calculation results are in accordance with the experimental results.
机译:用著名的M-S多晶模型分析和讨论了掺硼多晶金刚石薄膜的压电电阻效应。发现价带分裂和晶界散射是造成p型多晶金刚石膜压阻效应的主要因素。得到了包括背景散射和晶界散射影响的量表系数计算公式,计算结果与实验结果吻合。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号