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机译:Bi薄膜随温度变化的热导率的测量和理论分析
Chung Ang Univ, Dept Phys, Seoul 156756, South Korea;
Chung Ang Univ, Dept Phys, Seoul 156756, South Korea;
Chung Ang Univ, Dept Phys, Seoul 156756, South Korea;
Chung Ang Univ, Dept Phys, Seoul 156756, South Korea;
Chung Ang Univ, Dept Phys, Seoul 156756, South Korea;
Chung Ang Univ, Dept Phys, Seoul 156756, South Korea;
Thermal Conductivity; Bismuth; 3-omega Technique; Thermal Transport; Sondheimer Model; Callaway Model;
机译:n-Bi2Te3和p-Bi0.5Sb1.5Te3退火薄膜的厚度依赖性导热系数及理论分析
机译:P型铋锑碲化型温度依赖性导热率的各向异性行为(P-BI0.5SB1.5TE3)薄膜
机译:单相锑薄膜的温度相关导热系数:一种实验和理论方法
机译:光热辐射测量脉冲激光沉积亚微米{Sub} 2Te {Sub} 3薄膜的热导率评估
机译:通过扫描热探针法对非接触式和接触式探针与样品之间的热交换进行分析,以定量测量薄膜和纳米结构的热导率。
机译:通过控制薄膜厚度来降低磁铁矿薄膜的温度依赖性导热系数
机译:通过控制薄膜厚度来降低磁铁矿薄膜的温度依赖性导热系数
机译:用热比较仪测量介电薄膜固体薄膜的导热系数