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Correcting for 3D Distortion When Using Backscattered Electron Detectors in a Scanning Electron Microscope

机译:在扫描电子显微镜中使用反向散射电子探测器时校正3D失真

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摘要

A variable pressure scanning electron microscope (VPSEM) can produce a topographic surface relief of a physical object under examination, in addition to its two-dimensional (2D) image. This topographic surface relief is especially helpful when dealing with porous rock because it may elucidate the pore-space structure as well as grain shape and size. Whether the image accurately reproduces the physical object depends on the management of the hardware, acquisition, and postprocessing. Two problems become apparent during testing: (a) a topographic surface relief of a precision ball bearing is distorted and does not correspond to the physical dimensions of the actual sphere and (b) an image of a topographic surface relief of a Berea sandstone is geometrically tilted and topographically distorted even after standard corrections are applied. The procedure presented here is to ensure the veracity of the image, and includes: (a) adjusting the brightness and contrast levels originally provided by the manufacturer and (b) tuning the amplifiers of the back-scatter detector plates to be equal to each other, and producing zero voltage when VPSEM is idle. This procedure is tested and verified on the said two physical samples.
机译:除其二维(2D)图像外,可变压力扫描电子显微镜(VPSEM)还可产生所检查物理对象的形貌表面起伏。这种地形表面起伏在处理多孔岩石时特别有用,因为它可以阐明孔隙空间结构以及晶粒形状和大小。图像是否准确地再现物理对象取决于硬件的管理,采集和后处理。在测试过程中,有两个问题变得很明显:(a)精密滚珠轴承的地形表面起伏变形,并且不符合实际球体的物理尺寸;(b)Berea砂岩的地形表面起伏的图像在几何上即使应用了标准校正后,仍会倾斜并且地形变形。此处介绍的过程是为了确保图像的准确性,包括:(a)调整制造商最初提供的亮度和对比度级别,以及(b)将背向散射检测器板的放大器调整为彼此相等。 ,并且在VPSEM空闲时产生零电压。在上述两个物理样本上测试并验证了此过程。

著录项

  • 来源
    《Scanning》 |2009年第2期|59-64|共6页
  • 作者

    Jacob M. Proctor;

  • 作者单位

    Ingrain Rocks, Inc., Houston, Texas Ingrain Rocks, Inc., 3733 Westhcimcr Rd, Houston. TX 77063;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《化学文摘》(CA);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    3-D reconstruction; geology; SEM; surface analysis;

    机译:3-D重建;地质;SEM;表面分析;

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