ADVANCES IN ELECTRON CHANNELLING CONTRAST IMAGING AND ELECTRON BACKSCATTER DIFFRACTION FOR IMAGING AND ANALYSIS OF STRUCTURAL DEFECTS IN THE SCANNING ELECTRON MICROSCOPE

摘要

To summarise we have shown that ECCI allows direct, fast imaging of dislocations and sub-grain boundaries, while EBSD provides quantitative information on the magnitude and direction of misorientations a sample. Both techniques share the advantages of being non-destructive and can be used to interrogate and provide valuable information on defects from large areas of a sample.