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首页> 外文期刊>Review of Scientific Instruments >A high-efficiency spin-resolved photoemission spectrometer combining time-of-flight spectroscopy with exchange-scattering polarimetry
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A high-efficiency spin-resolved photoemission spectrometer combining time-of-flight spectroscopy with exchange-scattering polarimetry

机译:结合了飞行时间光谱和交换散射偏振法的高效自旋分辨光发射光谱仪

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摘要

We describe a spin-resolved electron spectrometer capable of uniquely efficient and high energy resolution measurements. Spin analysis is obtained through polarimetry based on low-energy exchange scattering from a ferromagnetic thin-film target. This approach can achieve a similar analyzing power (Sherman function) as state-of-the-art Mott scattering polarimeters, but with as much as 100 times improved efficiency due to increased reflectivity. Performance is further enhanced by integrating the polarimeter into a time-of-flight (TOF) based energy analysis scheme with a precise and flexible electrostatic lens system. The parallel acquisition of a range of electron kinetic energies afforded by the TOF approach results in an order of magnitude (or more) increase in efficiency compared to hemispherical analyzers. The lens system additionally features a 90° bandpass filter, which by removing unwanted parts of the photoelectron distribution allows the TOF technique to be performed at low electron drift energy and high energy resolution within a wide range of experimental parameters. The spectrometer is ideally suited for high-resolution spin- and angle-resolved photoemission spectroscopy (spin-ARPES), and initial results are shown. The TOF approach makes the spectrometer especially ideal for time-resolved spin-ARPES experiments. © 2010 American Institute of Physics Article Outline INTRODUCTION SPIN-RESOLVED TIME-OF-FLIGHT ELECTRON SPECTROMETER DESIGN Low energy exchange-scattering spin polarimeter TOF electron energy analyzer with 90° bandpass filter Data acquisition PERFORMANCE Energy calibration and resolution Spin resolution SUMMARY
机译:我们描述了一种自旋分辨电子光谱仪,能够进行独特的高效和高能量分辨率测量。自旋分析是基于铁磁薄膜靶材的低能交换散射通过极化法获得的。这种方法可以实现与最新的Mott散射旋光仪类似的分析能力(Sherman函数),但是由于反射率的提高,效率提高了100倍。通过将旋光仪集成到具有精确且灵活的静电透镜系统的基于飞行时间(TOF)的能量分析方案中,可以进一步提高性能。与半球形分析仪相比,TOF方法提供的一系列电子动能的并行采集导致效率提高一个数量级(或更多)。透镜系统还具有90°带通滤光片,该滤光片通过去除光电子分布中不需要的部分,可以在很宽的实验参数范围内以低电子漂移能量和高能量分辨率执行TOF技术。该光谱仪非常适合高分辨率自旋和角度分辨光发射光谱(spin-ARPES),并显示了初步结果。 TOF方法使光谱仪特别适合于时间分辨自旋ARPES实验。 ©2010美国物理研究所文章概述简介自旋分辨飞行时间电子光谱仪设计低能交换散射自旋旋光仪TOF电子能量分析仪,带90°带通滤波器数据采集性能能量校准和分辨率自旋分辨率概述

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  • 来源
    《Review of Scientific Instruments》 |2010年第5期|p.1-15|共15页
  • 作者单位

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA|Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA|Department of Physics, University of California Berkeley, California 94720, USA;

    Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

    Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

    Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA|Sandia National Laboratories, Livermore, California 94550, USA;

    Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

    Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA|Department of Physics, University of California Berkeley, California 94720, USA;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    electrostatic lenses; metal-insulator transition; photoelectron spectra; polarimetry; spin dynamics; thin films;

    机译:静电透镜;金属-绝缘体跃迁;光电子能谱;旋光性;自旋动力学;薄膜;

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