首页> 外文期刊>Research journal of applied science, engineering and technology >Comparative Study of 1.3 and 1.5 μm Light-Emitting Diodes GaAs-Based InAs/InGaAs and InAs/(Ga, In) (N, As) Self-Assembled Quantum Dots
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Comparative Study of 1.3 and 1.5 μm Light-Emitting Diodes GaAs-Based InAs/InGaAs and InAs/(Ga, In) (N, As) Self-Assembled Quantum Dots

机译:1.3和1.5μm发光二极管基于GaAs的InAs / InGaAs和InAs /(Ga,In)(N,As)自组装量子点的比较研究

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摘要

This study presents self-assembled quantum dots structures made on GaAs substrate. The samples were grown by Molecular Beam Epitaxy (MBE) in the Stranski-Krastanow (SK) growth mode. Two types of quantum dots structures are performed under different growth conditions and are compared: the first type is composed of two structures with InAs quantum dots encapsulated with (Ga, In) (N, As) and the second one with boxes wrapped with InGaAs. The influence of encapsulation of quantum dots is highlighted and as already shown, the redshift of emission wavelength depends on nitrogen doping. Further investigations are done through the incorporation of indium and nitrogen in the quantum dots structures in order to understand their optimal doping level on electrical and optical properties. The effects of temperature, an important growth parameter, are examined through images of nanostructures obtained by Atomic Force Microscopy (AFM) and Scanning Electronic Microscopy (SEM) techniques.
机译:这项研究提出了在GaAs衬底上制造的自组装量子点结构。样品通过分子束外延(MBE)在Stranski-Krastanow(SK)生长模式下生长。在不同的生长条件下执行两种类型的量子点结构并进行比较:第一种类型由两种结构组成,其中InAs量子点被(Ga,In)(N,As)封装,第二种结构由被InGaAs包裹的盒子。量子点封装的影响被突出显示,并且如已经显示的,发射波长的红移取决于氮掺杂。通过在量子点结构中掺入铟和氮来进行进一步的研究,以了解它们在电学和光学性质上的最佳掺杂水平。温度的影响是重要的生长参数,通过原子力显微镜(AFM)和扫描电子显微镜(SEM)技术获得的纳米结构图像可以检查温度的影响。

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    Laboratoire des Semi-conducteurs et d'Energie Solaire, Faculte des Sciences et Techniques, Universite Cheikh Anta Diop de Dakar, BP: 5005, Senegal;

    Laboratoire des Semi-conducteurs et d'Energie Solaire, Faculte des Sciences et Techniques, Universite Cheikh Anta Diop de Dakar, BP: 5005, Senegal;

    Laboratoire des Semi-conducteurs et d'Energie Solaire, Faculte des Sciences et Techniques, Universite Cheikh Anta Diop de Dakar, BP: 5005, Senegal;

    Laboratoire des Semi-conducteurs et d'Energie Solaire, Faculte des Sciences et Techniques, Universite Cheikh Anta Diop de Dakar, BP: 5005, Senegal;

    Laboratoire des Semi-conducteurs et d'Energie Solaire, Faculte des Sciences et Techniques, Universite Cheikh Anta Diop de Dakar, BP: 5005, Senegal;

    Groupe de Physique des Materiaux, Departement de Physique, Faculte des Sciences et Techniques, Universite Cheikh Anta Diop, BP: 5005, Dakar, Senegal;

    Centre de Recherche sur PHetero-epitaxie et ses Applications du CNRS, 06560, Valbonne, France;

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  • 正文语种 eng
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  • 关键词

    Dislocations; epitaxy; Molecular Beam Epitaxy (MBE); photoluminescence; quantum dots; RHEED; Scanning Electronic Microscopy (SEM);

    机译:脱位;外延分子束外延(MBE);光致发光量子点;RHEED;扫描电子显微镜(SEM);

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