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Characterization and modeling of 1.3 mum InAs quantum-dot lasers.

机译:1.3毫米InAs量子点激光器的表征和建模。

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Quantum-dot (QD) lasers have the potential to offer superior characteristics compared to currently used QW lasers in optical fiber communications. In this work we have performed modeling and characterization of QD lasers with an aim to understand the physics in order to design better lasers in the future. A comprehensive analytical model is built which explains the observed temperature sensitivity of threshold current in QD lasers. The model shows that the ratio of excitons and free carriers is important to accurately model the carrier distribution and hence temperature performance of QD lasers. To understand the recombination mechanisms in QD lasers, carrier lifetime measurements were performed along with advanced numerical rate equation modeling. The carrier lifetime measurements were performed using the small-signal optical response and impedance technique. The rate equation models were then used to extract the recombination coefficients in QD lasers which represent the strength of various recombination mechanisms. Using these measurements and the rate equation models it is shown that Auger recombination is the dominant contribution to current and comprises approximately 80% of current at threshold. Further, we investigated the origin of the low injection efficiencies observed in QD lasers using a rate equation model that included the effect of inhomogeneous broadening. It is shown that the observed low injection efficiencies are likely a consequence of the cavity length vs. slope efficiency measurement technique, and therefore do not represent the intrinsic or true injection efficiencies in QD lasers. The limitation of this commonly used technique arises from the carrier occupation of non-lasing states in the inhomogeneously broadened QD ensemble.
机译:与当前在光纤通信中使用的QW激光器相比,量子点(QD)激光器具有提供更优异特性的潜力。在这项工作中,我们进行了QD激光器的建模和表征,旨在了解物理原理,以便将来设计更好的激光器。建立了全面的分析模型,该模型解释了在QD激光器中观察到的阈值电流的温度敏感性。该模型表明,激子与自由载流子的比例对于准确地模拟载流子分布以及QD激光器的温度性能至关重要。为了了解QD激光器中的重组机制,对载流子寿命进行了测量,并采用了先进的数值速率方程模型。使用小信号光学响应和阻抗技术进行载流子寿命测量。然后使用速率方程模型提取QD激光器中的重组系数,这些系数代表了各种重组机制的强度。使用这些测量值和速率方程模型,可以发现俄歇复合是电流的主要贡献,在阈值时约占电流的80%。此外,我们使用速率方程模型研究了在QD激光器中观察到的低注入效率的起因,该模型包括不均匀展宽的影响。结果表明,观察到的低注入效率可能是腔长与斜率效率测量技术的结果,因此不能代表QD激光器固有的或真正的注入效率。这种普遍使用的技术的局限性来自非均匀扩展的QD集合中非激光状态的载流子占据。

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