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Storage availability of one-shot system under periodic inspection considering inspection error

机译:考虑检查误差的定期检查的单发系统的存储可用性

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This paper presents a model to fmd the optimal inspection intervals for one-shot system with n components under periodic inspection. We assume that the failure times of all components in a series structure are independent and follow an exponential distribution. In this model, the inspection is imperfect, and there can be undiscovered failures. The undiscovered failures can be detected at the following inspection time points. The interval availability and life cycle cost are considered as optimization criteria are derived analytically. A simulation algorithm procedure is also developed with Monte Carlo simulation to obtain the optimal inspection intervals. In illustration examples, we first calculate the system availability under periodic inspection through the analytical model and investigate the effect of inspection error on the storage availability. We then study the impacts of inspection and cost parameters on the optimal inspection intervals through a sensitivity analysis.
机译:本文提出了一个模型,用于确定具有n个组件的单次系统在定期检查下的最佳检查间隔。我们假设串联结构中所有组件的故障时间是独立的,并且遵循指数分布。在此模型中,检查是不完善的,并且可能存在未发现的故障。未发现的故障可以在以下检查时间点进行检测。间隔可用性和生命周期成本被视为优化标准,是通过分析得出的。还使用蒙特卡洛模拟开发了模拟算法程序,以获得最佳检查间隔。在说明示例中,我们首先通过分析模型计算定期检查下的系统可用性,然后研究检查错误对存储可用性的影响。然后,我们通过敏感性分析研究检查和成本参数对最佳检查间隔的影响。

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