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Processing Dependences of Microstructure of Ferroelectric Thin Films

机译:铁电薄膜微观结构的加工依赖性

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摘要

The ferroelectric thin film was widely investigated in detail in recent years. The ferroelectric properties of the thin films are obviously dependent on the microstructure of the film, which were influenced by some processing parameters for preparing the films, including precursor solution chemistry, nature of substrate, film thickness, and condition of heat treatment etc. In this paper, these processing dependences of the films are reviewed. The present article discuss some important patents related to ferroelectric thin films.
机译:近年来,对铁电薄膜进行了广泛的详细研究。薄膜的铁电性能显然取决于薄膜的微观结构,而薄膜的微结构受制于制备薄膜的一些工艺参数的影响,这些参数包括前驱体溶液的化学性质,基材的性质,薄膜的厚度以及热处理的条件等。在论文中,对胶片的这些处理依赖性进行了综述。本文讨论了与铁电薄膜有关的一些重要专利。

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