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Reliability Testing for Stacked Microvias in PWBs

机译:PWB中堆叠式微孔的可靠性测试

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摘要

Traditional single-level microvia structures generally are considered the most robust type of interconnection within a printed circuit board substrate. However, rapid implementation of high-density interconnect technology now commonly requires two, three or even four levels of microvias sequentially processed into the product. Stacked microvias require duplicating and/or additional process steps in fabrication, including filling of the microvia, which establishes an ability to sequentially ablate additional vias into a structure containing microvias stacked on both sides of the substrate (FIGURE 1).
机译:传统的单级微孔结构通常被认为是印刷电路板基板内最坚固的互连类型。但是,现在快速实施高密度互连技术通常需要依次将两个,三个或什至四个级别的微孔加工成产品。堆叠的微通孔在制造过程中需要重复和/或额外的处理步骤,包括填充微通孔,这建立了依次将附加的通孔烧蚀成包含堆叠在基板两侧的微通孔的结构的能力(图1)。

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