Making Boundary Scan Easy

摘要

It has been 20-plus years since the IEEE 1149.1 standard, commonly known as boundary scan or JTAG, came into existence. The boundary scan test method provides a means to electrically test the interconnection between two semiconductor devices equipped with boundary scan, and even devices without boundary scan, such as memories (DDR/Flash) and connectors, without the need for a test probe on every device pin.