首页>
外文期刊>Embedded System Engineering
>Boundary-scan DFT: headache or lifeline? Boundary-scan can provide valuable information throughout the product life-cycle
【24h】
Boundary-scan DFT: headache or lifeline? Boundary-scan can provide valuable information throughout the product life-cycle
BOUNDARY-SCAN technology (aka JTAG or IEEE Std 1149.1) has now existed for over 15 years and, whilst many engineers are aware of the facilities it can offer, there remain those who are unaware of the few simple design rules that can bring this technology to life. With an estimated 10,000 plus boundary-scan systems in operation world-wide even the most sceptical engineers would find it hard to deny the benefits that boundary-scan can offer, available not just during product development and manufacture, but throughout the product lifecycle.
展开▼