首页> 外文期刊>IEEE Transactions on Plasma Science >Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma
【24h】

Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma

机译:气体Z夹点氩等离子体的X射线软光谱研究

获取原文
获取原文并翻译 | 示例

摘要

X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal we have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 /spl Aring/ were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is around 120 /spl Aring/. The radiation energy in the spectral range is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors.
机译:使用X射线晶体光谱仪,X射线二极管和极紫外(XUV)光谱仪研究了由气袋Z捏装置产生的氩等离子体的X射线辐射特性。使用锗晶体,我们观察到了在收缩阶段由热点产生的Ar XVII的光谱发射。借助2-m掠入射XUV光谱仪,获得了30至250 / spl Aring /的光谱。观察到从Ar VIII到Ar XIII的强线,其连续峰的峰值约为120 / spl Aring /。光谱范围内的辐射能量估计约为23焦耳,约为电容器中存储的电能的0.6%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号