首页> 外文期刊>IEEE Transactions on Plasma Science >Investigation of the Radio-Frequency Discharge in a High Current Negative Hydrogen Ion Source With a Global Enhanced Vibrational Kinetic Model
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Investigation of the Radio-Frequency Discharge in a High Current Negative Hydrogen Ion Source With a Global Enhanced Vibrational Kinetic Model

机译:全局增强振动动力学模型研究高电流负氢离子源中的射频放电

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摘要

A numerical investigation of the radio-frequency hydrogen discharge in the high current negative hydrogen ion source (HCNHIS) is presented using a global enhanced vibrational kinetic model (GEVKM). The HCNHIS consists of a high-pressure (2-65 torr) radio-frequency discharge chamber where the main production of high-lying vibrational states of the hydrogen molecules occurs. The hydrogen plasma flow in the discharge chamber is reduced by a series of bypass tubes and enters through a nozzle into a low-pressure (1-15 mtorr) negative hydrogen ion production chamber where H are generated mainly by the dissociative attachment of low-energy electrons to rovibrationally excited hydrogen molecules. The GEVKM is applied to the HCNHIS discharge and involves volume-averaged equations for 21 hydrogen species (atoms, ions, and molecules in excited states) and electrons. The GEVKM is supplemented with outlet boundary conditions for the nozzle and bypass tubes of the HCNHIS and accounts for compressibility, viscous, and rarefaction effects. GEVKM simulations of the RF discharge are performed with inlet flow rates of 5-1000 sccm and absorbed powers of 200-1000 W using the HCNHIS-2 design which is configured with an extractor grid attached to a short negative ion production region. These simulations investigate the effects of the absorbed power and the inlet flow rate on the chemical composition, electron and heavy particles temperature, wall temperature, the maximum extractable H current in the discharge chamber, as well as optimum operational parameters of HCNHIS-2. GEVKM simulations of the HCNHIS-2 discharge are used to obtain estimates of the H current and compared with Faraday cup measurements taken at the extraction grid.
机译:使用全局增强的振动动力学模型(GEVKM),对高电流负氢离子源(HCNHIS)中的射频氢放电进行了数值研究。 HCNHIS由高压(2-65托)射频放电室组成,主要产生氢分子的高振动态。放电室中的氢等离子体流通过一系列旁通管减少,并通过喷嘴进入低压(1-15 mtorr)负氢离子产生室,其中H的产生主要是由于低能的解离连接电子可以快速激发氢分子。 GEVKM用于HCNHIS放电,涉及21种氢物种(处于激发态的原子,离子和分子)和电子的体积平均方程。 GEVKM补充了HCNHIS的喷嘴和旁通管的出口边界条件,并考虑了可压缩性,粘性和稀疏效应。使用HCNHIS-2设计,其中入口气流为5-1000 sccm,吸收功率为200-1000 W,对RF放电进行GEVKM仿真,该设计配置有连接到短负离子产生区域的萃取栅。这些模拟研究了吸收功率和入口流速对化学成分,电子和重粒子温度,壁温,放电室内最大可提取H电流以及HCNHIS-2最佳运行参数的影响。 HCNHIS-2放电的GEVKM模拟用于获得H电流的估计值,并将其与提取网格处的法拉第杯测量值进行比较。

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