Sweden's Uppsala University and IBM jointly develop a rotary UHV system for advanced core- level spectroscopy

摘要

The system is part of IBM's undulator beam-line at the Advanced Light Source (ALS) in Berkeley, California. The rotary system allows angle-resolved measurements of photoelectron and x-ray emission spectra from solids and surfaces where the direction of analysis can be varied relative to the polarization direction of the incident synchrotron radiation.