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机译:垂直,倾斜和平行边界对硅中引导的Cherenkov发射的干扰效应
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14850, USA Brockhouse Institute for Materials Research and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada, L8S 4L7;
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14850, USA Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, CA 91125, USA;
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14850, USA;
collective excitations (including excitons, polarons, plasmons and other charge-density excitations); cherenkov radiation; electron energy loss spectroscopy; transmission electron microscopy (TEM) (including STEM, HRTEM, etc.);
机译:斜束干涉在多模硅波导中的模式选择
机译:多模硅波导中的模式选择的斜束干扰
机译:热载流子应力对具有单个垂直晶界的高性能多晶硅薄膜晶体管的影响
机译:通过平行于垂直的动能耦合效应控制量子干扰的符号来调制光吸收
机译:掺二氧化硅/硅纳米晶多层结构中的发光和缝隙波导效应。
机译:由两个并行OCT传感器引导手持智能注射器的斜注射深度校正
机译:剪切在离子平行漂移速度和非均匀垂直电场上的影响在倾斜离子声波产生时