首页> 外文学位 >Light Emission and Slot Waveguide Effect in erbium-doped silicon dioxide/silicon nanocrystalline Multilayer Structures.
【24h】

Light Emission and Slot Waveguide Effect in erbium-doped silicon dioxide/silicon nanocrystalline Multilayer Structures.

机译:掺二氧化硅/硅纳米晶多层结构中的发光和缝隙波导效应。

获取原文
获取原文并翻译 | 示例

摘要

In this thesis, Er doped SiO2/nc-Si multilayer structure - a promising material for on-chip silicon light emission devices, is studied in detail.;It is demonstrated, for the first time, that infrared Er emission could be enhanced by an Er doped SiO2/nc-Si multilayer structure. It is also determined that energy transfer from nc-Si to nearby Er ions, is responsible for this emission enhancement.;The SiO2/nc-Si multilayer structure also works as a horizontal multi-slot waveguide, in which a high percentage of photons are strongly confined in the nanometer thin SiO2 layers, where the refractive index is lower than its surrounding environments. Owing to this unique photon distribution, we theoretically predicted and experimentally demonstrated that free carrier absorption (FCA) could be strongly suppressed. Our observation of free carrier suppression in this structure is the first experimental demonstration of this effect in a slot waveguide.;Scattering loss from multiple interfaces in this device is the price needed to be paid for this benefit. To see if the costs outweigh the benefits, we proposed a model to theoretically calculate the scattering loss. Experimental measurements of the scattering loss, using a top scattering method, agree well with the simulation results. Based on the Er emission enhancement, the FCA suppression and the scattering loss due to multiple interfaces, a detailed parametric study suggested that overall optical gain at 1535 nm could be achieved under certain conditions. The last piece of our experiment is an ultrafast pump probe study of our device. The obtained results confirmed our observation of FCA suppression in the slot structure, and clearly showed a significant difference between Er doped and non-Er doped samples.;This thesis is concluded with our vision for future research direction, including the optimization and detailed explanation of the energy transfer to achieve infrared optical gain from Er. We believe that the studies presented here will be fundamental to achieve the ultimate goal of an electrically pumped on-chip silicon laser device based on this material structure.
机译:本文详细研究了掺Er的SiO2 / nc-Si多层结构-一种有望用于片上硅发光器件的材料。掺do的SiO2 / nc-Si多层结构。还确定了从nc-Si到附近的Er离子的能量转移是造成这种发射增强的原因; SiO2 / nc-Si多层结构还可以用作水平多缝波导,其中光子的百分比很高强烈限制在纳米SiO2薄层中,其折射率低于其周围环境。由于这种独特的光子分布,我们在理论上进行了预测和实验证明,自由载流子吸收(FCA)可以得到强烈抑制。我们在这种结构中对自由载流子抑制的观察是在缝隙波导中这种效应的第一个实验证明。;该器件中多个接口的散射损耗是为此需要付出的代价。为了查看成本是否超过收益,我们提出了一个模型来从理论上计算散射损耗。使用顶部散射法进行的散射损耗实验测量与模拟结果非常吻合。基于Er发射增强,FCA抑制和多个界面引起的散射损耗,详细的参数研究表明,在某些条件下可以实现1535 nm的整体光学增益。实验的最后一部分是对我们的设备进行超快泵浦探针研究。得到的结果证实了我们在缝隙结构中对FCA抑制的观察,并清楚地表明掺Er和不掺Er的样品之间存在显着差异。本论文是基于我们对未来研究方向的展望而得出的,包括优化和详细解释。能量转移以实现Er的红外光增益。我们相信,此处介绍的研究将是实现基于这种材料结构的电泵浦芯片上硅激光器的最终目标的基础。

著录项

  • 作者

    Fu, Yijing.;

  • 作者单位

    University of Rochester.;

  • 授予单位 University of Rochester.;
  • 学科 Physics Optics.
  • 学位 Ph.D.
  • 年度 2012
  • 页码 182 p.
  • 总页数 182
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号