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Tunable thermal quenching of photoluminescence in Mg-doped p-type GaN

机译:掺镁的p型GaN中光致发光的可调热猝灭

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摘要

We have studied the thermal quenching of the ultraviolet luminescence band with a maximum at about 3.25 eV in p-type Mg-doped GaN. The characteristic temperature of the thermal quenching of photoluminescence (PL) gradually shifted to higher temperatures with increasing excitation intensity. This effect is explained by a population inversion of charge carriers at low temperatures, which suddenly converts into a quasiequilibrium population as the temperature increases above the characteristic value. Tunable quenching of PL has been observed only in some of the GaN:Mg samples. The absence of the tunable quenching of PL in another group of GaN:Mg samples is preliminarily attributed to different types of dominant nonradiative defects in the two groups of samples.
机译:我们研究了在p型掺杂Mg的GaN中最大约3.25 eV的紫外发光带的热猝灭。随着激发强度的增加,光致发光(PL)的热淬灭的特征温度逐渐转变为更高的温度。低温下电荷载流子的总体反转可以解释这种效应,当温度升高到特征值以上时,电荷载流子突然转换为准平衡总体。仅在某些GaN:Mg样品中观察到PL的可调节淬灭。另一组GaN:Mg样品中PL的可调猝灭的缺乏初步归因于两组样品中不同类型的主要非辐射缺陷。

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  • 来源
    《Physical review》 |2013年第11期|115205.1-115205.4|共4页
  • 作者单位

    Department of Physics, Virginia Commonwealth University, Richmond, Virginia 23284, USA;

    Department of Physics, Virginia Commonwealth University, Richmond, Virginia 23284, USA;

    Paul-Drude-Institut fuer Festkoerperlektronik, Berlin 10117, Germany;

    Paul-Drude-Institut fuer Festkoerperlektronik, Berlin 10117, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Ⅲ-Ⅴ semiconductors;

    机译:Ⅲ-Ⅴ族半导体;

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