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Classical limit of the Casimir interaction for thin films with applications to graphene

机译:薄膜与石墨烯的卡西米尔相互作用的经典极限

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摘要

The Casimir interaction between two thin material films, between a film and a thick plate, and between two films deposited on substrates is considered at large separations (high temperatures) which correspond to the classical limit. It is shown that the free energy of the classical Casimir interaction between two insulating films with no free charge carriers and between an insulating film and a material plate depends on film thicknesses and decreases with separation more rapidly than the classical limit for two thick plates. The free energy of thin films characterized by the metallic-type dielectric permittivity decreases as the second power of separation, i.e., demonstrates the standard classical limit. The obtained results shed light on the possibility to describe dispersion interaction between two graphene sheets and between a graphene sheet and a material plate by modeling graphene as a thin film possessing some dielectric permittivity. It is argued that the most reliable results are obtained by describing the reflection properties on graphene by means of the polarization tensor in (2 + l)-dimensional space-time.
机译:在大的间距(高温)下考虑了两个薄材料薄膜之间,薄膜与厚板之间以及沉积在基板上的两个薄膜之间的卡西米尔相互作用,这与经典极限值相对应。结果表明,在没有自由电荷载流子的两个绝缘膜之间以及在绝缘膜和材料板之间的经典卡西米尔相互作用的自由能取决于膜的厚度,并且随着分离而减小,其速度比两个厚板的经典极限更快。以金属型介电常数为特征的薄膜的自由能随着二次分离力的降低而降低,即证明了标准的经典极限。所得结果揭示了通过将石墨烯建模为具有一定介电常数的薄膜来描述两个石墨烯片之间以及石墨烯片和材料板之间的分散相互作用的可能性。认为最可靠的结果是通过在(2 + 1)维时空中使用偏振张量描述石墨烯上的反射特性而获得的。

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  • 来源
    《Physical review》 |2014年第3期|035407.1-035407.10|共10页
  • 作者单位

    Central Astronomical Observatory at Pulkovo of the Russian Academy of Sciences, St. Petersburg 196140, Russia and Institute of Physics, Nanotechnology and Telecommunications, St. Petersburg State Polytechnical University, St. Petersburg 195251, Russia;

    Central Astronomical Observatory at Pulkovo of the Russian Academy of Sciences, St. Petersburg 196140, Russia and Institute of Physics, Nanotechnology and Telecommunications, St. Petersburg State Polytechnical University, St. Petersburg 195251, Russia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    optical properties of bulk materials and thin films; specific calculations;

    机译:散装材料和薄膜的光学性能;具体计算;

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