机译:使用van der Pauw技术测量单晶的各向异性电阻率
Center for Materials Crystallography, Department of Chemistry and iNANO, Aarhus University, DK-8000 Aarhus, Denmark;
Center for Materials Crystallography, Department of Chemistry and iNANO, Aarhus University, DK-8000 Aarhus, Denmark;
Materials Science, California Institute of Technology, Pasadena, California 91125, USA;
Materials Science, California Institute of Technology, Pasadena, California 91125, USA,ITMO University, Saint Petersburg, Russia;
Center for Materials Crystallography, Department of Chemistry and iNANO, Aarhus University, DK-8000 Aarhus, Denmark;
conductivity phenomena in semiconductors and insulators; methods of materials testing and analysis; thermoelectric, electrogasdynamic and other direct energy conversion;
机译:一种用于测量厚度变化的热电材料的电阻率和热功率的改进的范德鲍装置
机译:测量各向异性半导体膜的电导率张量的改进范德PAUW方法
机译:用van der Pauw技术对电极放置对金刚石砧盒中精确电阻率测量的影响进行有限元分析
机译:使用van-Der-Pauw(VDP)方法测量NDFEB磁体上的电阻率
机译:I.大范德华群的红外光解离光谱。二。紫外激光诱导的单结晶表面上五碳碳铁的光化学性质
机译:具有磁性和拓扑特性的天然范德华力异质单晶
机译:使用van der Pauw技术测量单晶的各向异性电阻率
机译:接触尺寸对van der pauw电阻率和霍尔系数测量方法的影响。