Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures

摘要

Interfaces are of critical importance to many materials and phenomena yet are difficult to probe. This difficulty is compounded in three-dimensional nanostructures and with delicate organic materials. Here we demonstrate a quantitative spectral analysis of resonant soft x-ray scattering that can accurately measure properties of buried nonplanar interfaces within polymeric systems. We measure the scattering invariant on an absolute scale to quantify the interfacial volume and width involved in mixing at the interface of block copolymer nanostructures. Using continuous contrast tuning, this spectral analysis enables the separation and identification of any number of unique scatterers in complex nanostructures.